EDX-7200/8100 Energy Dispersive X-ray Fluorescence Spectrometers from Shimadzu Scientific Instruments

Description

Incorporating a new high-performance semiconductor detector, the EDX-7200/8100 spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research.

The systems’ new state-of-the-art semiconductor detector (SDD) offers a high fluorescent X-ray count per unit time. This enables precise, high-resolution analysis while increasing throughput, allowing researchers and labs to increase their productivity without sacrificing accuracy. In addition, since it is electronically cooled, the SDD does not require liquid nitrogen. This reduces operating costs and maintenance requirements. When combined with optimized optics and five primary filters, the EDX-7200/8100 spectrometers achieve unprecedented levels of sensitivity and energy resolution.

Features
  • Measurement ranges of 11Na to 92U (EDX-7000) and 6C to 92U (EDX-8000)
  • Five primary filters – enable highly sensitive analysis of trace elements
  • Sample observation camera
  • Large sample chamber – accommodates virtually any sample type
PCEDX Navi operating software features a simple but refined user interface, and offers intuitive operation, easy instrument initialization and startup, and a variety of report formats. A variety of optional equipment, including a vacuum measurement unit, helium purge unit, and screening analysis kit, is available to address specific applications.