Malvern Panalytical has launched a new version of its Aeris compact X-ray diffractometer (XRD). The new Aeris model is designed for use in all environments. Specifically, grazing-incidence XRD (GIXRD) will enable the examination of thin films and coatings, while transmission measurements will provide more accurate data that are not affected by sample preparation artefacts.
The Aeris XRD is a compact system that provides high quality data from polycrystalline materials at competitive speeds. The performance of the Aeris is similar to floor standing systems. It does not require any external supplies and infrastructure and is highly cost effective. Additionally, Aeris can be used in a regulated environment with OmniTrust software.
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With the new Aeris, researchers can obtain detailed, accurate data more easily, opening possibilities for smaller companies in the pharmaceutical and coatings industries, as well as educational institutions, to contribute to scientific research and process development.
“I’m very proud that we’re launching our new Aeris – a model that continually raises the bar for powder XRD. By providing the data quality of a floor-standing system in a compact instrument, the new Aeris will enable a wider range of our customers to carry out in-depth materials analysis and optimize their processes – helping push the scientific frontier even further forward,” Wilijan Vissers, Product Manager Aeris said.