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Newsletter Sponsor
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Introducing the PerkinElmer NexION® 2000 ICP-MS
Trace metals, nanomaterials, and impurities, these are just a few of the challenges our new NexION® 2000 ICP-MS thrives on. With an all matrix solution and extended dynamic range features, you can run samples with high total dissolved solids without manual dilution and with the flexibility to measure both high- and low-level elements simultaneously. The system has universal cell technology, fast data acquisition, and enables you to measure any particle size. All of this, in the lowest maintenance ICP-MS on the market.
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