Rigaku Corporation, a leading company producing X-ray analysis instruments, and JEOL Ltd. a leading company producing electron microscopes and other analytical instruments have announced the launch of the XtaLAB Synergy-ED, an integrated electron diffraction platform for the determination of molecular structures from nanocrystals.
XtaLAB Synergy-ED is a new and fully integrated electron diffractometer, creating a seamless workflow from data collection to structure determination of three-dimensional molecular structures.
The XtaLAB Synergy-ED is the result of an innovative collaboration to synergistically combine our core technologies: Rigaku’s high-speed, high-sensitivity photon-counting detector (HyPix-ED) and state-of-the-art instrument control and single crystal analysis software platform (CrysAlis Pro for ED), and JEOL’s long-term expertise and market leadership in designing and producing transmission electron microscopes. The key feature of this product is that it provides researchers an integrated platform enabling easy access to electron crystallography. The XtaLAB Synergy-ED is a system any X-ray crystallographer will find it intuitive to operate without having to become an expert in electron Microscopy.
Izumi Oi, President & COO of JEOL Ltd., says:
We are proud that the collaboration between Rigaku and JEOL has created a synergistic effect among the core technologies of both companies and reached the point to announce the new platform XtaLAB Synergy-ED. Since its foundation, JEOL's main goal has continued to be "contributing to the progress in both Science and Human Society" on the basis of "Creativity" and "Research & Development". As progress in science and technology has been remarkable and the roles expected from a company are diversifying, we will continue to provide solutions matching the needs enabling customer innovation.
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